Page 5 - VSDC_MayApr2018_eMag

Mar/Apr 2018

目录 CONTENTS

TECHNOLOGY TRENDS COVER STORY

8 Light source evaluation
CCD相机 3D measurement
镜头 A new evaluation method for the intensity of Active pattern projection improves AOI 3D
backlight measurement accuracy
被测物体
A new assessment method is proposed in this paper:
光源 3D phase shift pattern projector system
the brightness of backlighting should be evaluated, combines high-resolution, telecentric lens and
and the conclusion is demonstrated through 18 large-format camera.
experiments.
10 SWIR Light source
Short-wave infrared enhances machine vision THINKINGS & VIEWPOINTS
Light source selection in the SWIR is very critical to 28 The industrial vision machine, what a painful
achieve a successful imaging solution. The SWIR understanding
band can enable differentiation and detection of A senior guy with many years in the field of
defects which are invisible to the naked eye.
machine vision has summarized problems
encountered in the development of industrial
15 Embedded vision machine vision and discussed the solutions.
Integrating visual functions in the embedded
systems INTERVIEW
Embedded visual architecture can achieve smaller
and more efficient visual solutions, and optimize 30 Machine vision is combining with various
product cost performance. intelligent technologies
—Reports for Vision China Shanghai interviews
APPLICATIONS & SOLUTIONS 4 EDITOR'S NOTES
22 Neural Networks 6 LEADING EDGE SNAPSHOTS
Neural networks help identify license plates for
traffic control 40 PRODUCTS HIGHLIGHTS
Combining off-the-shelf cameras and a PC running 44 AD INDEX
neural network software allows Singapore authorities
to perform traffic monitoring and enforcement.
免费下载白皮书
6
1 25 Label detection http://www.vision-systems-china.com/white_paper.asp
5
7
Intelligent labeling system and its application
2
The intelligent labeling system can carry on 100%
quality inspection to the product, realize high speed,
3
4
high precision and high consistency quality control, 满足 SAE 平视显示
and reduce the risk of leak detection to the lowest. 器 (HUD) 测量标准
的自动化解决方案
27 Wafer inspection
Detection of silicon wafer defects by short
wave infrared camera 三维智能传感器应对
Allied Vision's short wave infrared (SWIR) camera is 表面检测挑战
applied to infrared microscopic imaging, which can
detect defects in semiconductor manufacturing process.
关于雅时国际商讯 (ACT International)
雅时国际商讯（ACT International）成立于1998年，为高速增长的中国市场中广大高技术行业服务。ACT通过它的一系列产品－包括杂志和网上出版物、培训、会议和活动－为跨国公司及中国企业架设了拓展中国市场
的桥梁。 ACT的产品包括多种技术杂志和相关的网站，以及各种技术会议，服务于机器视觉设计、电子制造、激光/ 光电子、射频/ 微波、化合物半导体、洁净及污染控制、电磁兼容等领域的约十多万专业读者。ACT
亦是若干世界领先技术出版社及展会的销售代表。ACT总部在香港，在北京、上海、深圳和武汉设有联络处。www.actintl.com.hk
About ACT International Media Group
ACT International, established 1998, serves a wide range of high technology sectors in the high-growth China market. Through its range of products -- including magazines and online publishing, training, conferences and events --
ACT delivers proven access to the China market for international marketing companies and local enterprises. ACT's portfolio includes multiple technical magazine titles and related websites plus a range of conferences serving more
than 100,000 professional readers in fields of electronic manufacturing, vision system design, laser/photonics, RF/microwave, cleanroom and contamination control, compound semiconductor, and Electromagnetic Compatibility. ACT
International is also the sales representative for a number of world leading technical publishers and event organizers. ACT is headquartered in Hong Kong and operates liaison offices in Beijing, Shanghai,Shenzhen and Wuhan.
www.actintl.com.hk

视觉系统设计 Vision Systems Design China Mar/Apr 2018 3